121. Structure-Property Relationships in Surface-Modified Ceramics

پدیدآورنده :

کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)

موضوع : Physical organic chemistry.,Surfaces (Physics)

رده :
TA455
.
C43
E358
1989

122. Symposium on Cleaning and Materials Processing for Electronics and Space Apparatus

پدیدآورنده :

کتابخانه: Library of Razi Metallurgical Research Center (Tehran)

موضوع : Cleaning ، Electronic apparatus and appliances,، Semiconductors

رده :
TK
7870
.
S934
1963

123. Techniques for Nuclear and Particle Physics Experiments :

پدیدآورنده :

کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)

موضوع : Engineering.,Physics.

رده :
QC793
.
46
B995
1994

124. Test and diagnosis for small-delay defects

پدیدآورنده :

کتابخانه: Central Library and Document Center of Shahid Chamran University (Khuzestan)

موضوع : Integrated circuits--Very large scale integration--Defects,Integrated circuits--Very large scale integration--Testing,Delay faults (Semiconductors)

رده :
TK
,
7874
,.
T4323
,
2011

125. Test and diagnosis for small-delay defects

پدیدآورنده :

کتابخانه: University of Tabriz Library, Documentation and Publication Center (East Azarbaijan)

موضوع : Integrated circuits--Very large scale integration--Defects,Integrated circuits--Very large scale integration--Testing,Delay faults (Semiconductors)

رده :
TK7874
.
T4323
2011

126. Testing and reliable design of CMOS circuits

پدیدآورنده :

کتابخانه: Library of Niroo Research Institue (Tehran)

موضوع : ، Metal oxide semiconductors, Complimentary- Testing,، Metal oxide semiconductors, Complimentary- Reliability,، Integrated circuits- Very large scale integration- Design and construction

127. Testing and reliable design of CMOS circuits

پدیدآورنده :

کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)

موضوع : ، Metal oxide semiconductors, Complimentary -- Testing,، Metal oxide semiconductors, Complimentary -- Reliability,، Integrated circuits -- Very large scale integration -- Design and construction

رده :
TK
7871
.
99
.
M44
J49

128. Testing novel water oxidation catalysts for solar fuels production /

پدیدآورنده :

کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)

موضوع : Solar energy.,Water-- Oxidation.,Catalysis.,Electrochemistry.,Energy Materials.,Renewable and Green Energy.,SCIENCE-- Chemistry-- Inorganic.,Solar energy.,Water-- Oxidation.

رده :
QD169
.
W3
O88
2019

129. The role of microscopy in semiconductor failure analysis

پدیدآورنده :

کتابخانه: Central Library of Amirkabir University of Technology (Tehran)

موضوع : Semiconductors - Testing , Semiconductors - Failures , Microscopes

رده :
TK
7871
.
85
.
R464

130. The silicon dragon :

پدیدآورنده :

کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)

موضوع : High technology industries-- Taiwan.,BUSINESS & ECONOMICS-- Industries-- Service.,High technology industries.,Industrie,Spitzentechnologie,Taiwan,Taiwan., 7, 7

رده :
HC430
.
5
.
Z9
H538
2006eb

131. Transmission electron microscopy of semiconductor nanostructures :

پدیدآورنده :

کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)

موضوع : Semiconductors-- Analysis.,Semiconductors-- Microscopy.,Transmission electron microscopy.,33.68 surfaces, interfaces and thin layers.,51.39 materials testing, properties of materials: other.,Durchstrahlungselektronenmikroskopie,Durchstrahlungselektronenmikroskopie.,Física moderna.,Nanostruktur,Nanostruktur.,Semiconductors-- Analysis.,Transmission electron microscopy.,Verbindungshalbleiter,Verbindungshalbleiter.

رده :
QD139
.
S34
R67
2003

132. Understanding smart sensors /

پدیدآورنده :

کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)

موضوع : Application-specific integrated circuits.,Detectors-- Design and construction.,Programmable controllers.,Semiconductors.,Signal processing-- Digital techniques.,Application-specific integrated circuits.,Detectors-- Design and construction.,Programmable controllers.,Semiconductors.,Signal processing-- Digital techniques.,TECHNOLOGY & ENGINEERING-- Technical & Manufacturing Industries & Trades.

رده :
TA165
.
F724
2013eb

133. Wafer-level testing and test during burn-in for integrated circuits /

پدیدآورنده :

کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)

موضوع : Integrated circuits-- Testing.,Integrated circuits-- Wafer-scale integration.,Semiconductors-- Testing.,Integrated circuits-- Testing.,Integrated circuits-- Wafer-scale integration.,Semiconductors-- Testing.,TECHNOLOGY & ENGINEERING-- Electronics-- Digital.,TECHNOLOGY & ENGINEERING-- Electronics-- Microelectronics.

رده :
TK7874
.
B35
2010

134. Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty

پدیدآورنده :

کتابخانه: Library and Information Center of Ayatollah Imani of Salman Farsi University (Fars)

موضوع : Integrated circuits, Testing,Integrated circuits, Wafer-scale integration,Semiconductors, Testing

رده :
TK
7874
.
B22W3
2010

135. X-ray absorption spectroscopy of semiconductors

پدیدآورنده :

کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)

موضوع : Semiconductors--Testing,X-ray spectroscopy.,X-rays--Industrial applications

رده :
TK7871
.
85
.
X7
2015

136. delay defects-Test and diagnosis for small

کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)

موضوع : Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Delay faults (Semiconductors) ;

137. metric CMOS VLSI circuits-oriented testing for nano-Defect

کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)

موضوع : Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Metal oxide semiconductors, Complementary ; Defects. ; Metal oxide semiconductors, Complementary ; Testing. ;