121. Wafer-level testing and test during burn-in for integrated circuits /
پدیدآورنده : Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Integrated circuits-- Testing.,Integrated circuits-- Wafer-scale integration.,Semiconductors-- Testing.,Integrated circuits-- Testing.,Integrated circuits-- Wafer-scale integration.,Semiconductors-- Testing.,TECHNOLOGY & ENGINEERING-- Electronics-- Digital.,TECHNOLOGY & ENGINEERING-- Electronics-- Microelectronics.
رده :
TK7874
.
B35
2010
122. Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty
پدیدآورنده : Bahukudumbi, Sudarshan.
کتابخانه: Library and Information Center of Ayatollah Imani of Salman Farsi University (Fars)
موضوع : Integrated circuits, Testing,Integrated circuits, Wafer-scale integration,Semiconductors, Testing
رده :
TK
7874
.
B22W3
2010
123. X-ray absorption spectroscopy of semiconductors
پدیدآورنده : / Claudia S. Schnohr, Mark C. Ridgway, editors
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors--Testing,X-ray spectroscopy.,X-rays--Industrial applications
رده :
TK7871
.
85
.
X7
2015
124. delay defects-Test and diagnosis for small
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Delay faults (Semiconductors) ;
125. metric CMOS VLSI circuits-oriented testing for nano-Defect
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : Integrated circuits ; Very large scale integration ; Defects. ; Integrated circuits ; Very large scale integration ; Testing. ; Metal oxide semiconductors, Complementary ; Defects. ; Metal oxide semiconductors, Complementary ; Testing. ;
